All
epitaxial wafers are thoroughly inspected and tested as
per customer specifications. In addition, we monitor the
epitaxial process by using the real-time statistical process
control (SPC) method for each individual specification.
Our real-time data logging system ensures epi wafer traceability.
With a strong background of semiconductor device experience
in our engineering department, we can also provide faster
and better support to our customers.
Advanced
EPI Technology Corporation is
ISO 9001:2000 Certified.
To view our certificates in pdf format, click below:
